CSDL sách
- IDDQ testing of VLSI circuits (Kluwer international series in engineering & computer science)
- Tác giả: Ravi K. Gulati, Charles F. Hawkins
- Nhà xuất bản: Kluwer Academic publishers - Boston
- Năm xuất bản: 1993
- Số trang:120 p.
- Kích thước:25 cm.
- Số đăng ký cá biệt:32156
- ISBN:0792393155
- Mã Dewey:621.395
- Đơn giá:0
- Vị trí lưu trữ:Tồn kho (03 Quang Trung)
- Ngôn ngữ:English
- Loại tài liệu:Sách Chuyên ngành
- Đang rỗi/ Tổng sách:1/1
- Từ khóa:Intergrated circuits; Metal oxide semiconductors
- Chủ đề: Interactive multimedia--Authoring programs
- Chuyên ngành: Khoa Điện - Điện tử
- Tóm tắt: Quiescent power current testing of CMOS intergrated circuits is a technique for production quality and reliability improvement, design validation, and failure analysis. It has been used for many years by a few companies and is now receiving wide acceptance as an industry tool. This article begins with a brief history of CMOS ÍC to provide perspective on the origin of IDDQ testing,...
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